The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 11, 2025
Filed:
Nov. 17, 2022
International Business Machines Corporation, Armonk, NY (US);
Xiao Ming Ma, Xi'an, CN;
Wen Pei Yu, Xian, CN;
Jing James Xu, Xi'an, CN;
Xue Ying Zhang, Xi'an, CN;
Si Er Han, Xi'an, CN;
Jing Xu, Xi'an, CN;
Jun Wang, Xi'an, CN;
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Abstract
A method, computer system, and a computer program product are provided for post-modeling feature evaluation. In one embodiment, at least at least one post model visual output and associated data is obtained that at least includes an individual conditional expectation (ICE) plot and a partial dependence (PDP) plot. Using the associated data and the plots, a Feature Importance (PI) plot is provided. A plurality of features is then determined for each PI, PDP and ICE plots to calculate at least one Interesting Value for each plot. An overall score is also calculated for each plurality of features based on the associated Interesting Values for each PDP, ICE and PI plots. At least one top feature is selected based on said scores. A final plot is then generated at least reflecting the top feature. The final plot combines the PI, PDP and ICE plots together.