The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 11, 2025

Filed:

Dec. 02, 2019
Applicant:

Jfe Steel Corporation, Tokyo, JP;

Inventors:

Kazuhiro Nakatsuji, Tokyo, JP;

Osamu Yamaguchi, Tokyo, JP;

Hiroyuki Takagi, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/27 (2020.01); B22D 11/16 (2006.01); C22F 1/00 (2006.01); G06F 18/214 (2023.01); G06V 10/44 (2022.01);
U.S. Cl.
CPC ...
G06F 30/27 (2020.01); B22D 11/16 (2013.01); C22F 1/00 (2013.01); G06F 18/214 (2023.01); G06V 10/443 (2022.01);
Abstract

A design support method capable of accurately obtaining predicted values, while also considering production conditions of a metal material, and of reducing the time required for design is provided. The design support method uses a calculator to support design of metal material with desired characteristics and includes searching for design conditions yielding the desired characteristics using a prediction model for predicting a characteristic value of the metal material from the design conditions, the prediction model being constructed based on past performance data associating the design conditions, including chemical composition and production conditions of the metal material, with the characteristic value. The design support method also includes presenting at least the chemical composition and production conditions among the design conditions that are searched for and correspond to the desired characteristics. The design conditions are searched for so that deviation among predicted values based on different training data sets is reduced.


Find Patent Forward Citations

Loading…