The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 11, 2025
Filed:
Mar. 03, 2022
Applicant:
Wiz, Inc., New York, NY (US);
Inventors:
Yaniv Shaked, Tel Aviv, IL;
Ami Luttwak, Binyamina, IL;
Gal Kozoshnik, Petach Tikva, IL;
Roy Reznik, Tel Aviv, IL;
Yarin Miran, Rishon Lezion, IL;
Assignee:
Wiz, Inc., New York, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/57 (2013.01); G06F 9/455 (2018.01); G06F 9/50 (2006.01); G06F 16/28 (2019.01);
U.S. Cl.
CPC ...
G06F 21/577 (2013.01); G06F 9/45558 (2013.01); G06F 9/5072 (2013.01); G06F 9/5077 (2013.01); G06F 16/288 (2019.01); G06F 2009/4557 (2013.01); G06F 2009/45587 (2013.01); G06F 2009/45595 (2013.01);
Abstract
An architecture of a multi-cloud inspector for any computing device type is provided. According to an embodiment, a method for implementing multi-cloud inspection includes accessing an object list, determining which objects to inspect, determining which inspectors to use, creating object copies, providing and running inspectors for each object copy, receiving inspection report summaries, generating an enriched dataset, and adding the enriched dataset to a security graph database.