The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 11, 2025

Filed:

Aug. 17, 2022
Applicant:

Seeq Corporation, Seattle, WA (US);

Inventors:

Brian Parsonnet, Fort Collins, CO (US);

Alberto Rivas, Houston, TX (US);

Assignee:

Seeq Corporation, Seattle, WA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/901 (2019.01); G05B 23/02 (2006.01); G06F 3/04847 (2022.01);
U.S. Cl.
CPC ...
G06F 16/9024 (2019.01); G05B 23/024 (2013.01); G06F 3/04847 (2013.01); G06F 2218/00 (2023.01);
Abstract

A method that incorporates a 'detail level' setting by means of a slider bar, which may be presented in a graphical user interface, that can used to choose a display level of data to display. At one extreme, the system generates a data display of minimum and maximum values for a set of data of time-series data set being displayed. At the other extreme, the system provides a single “average.” However, between the extremes, the system displays a representation of sets of data that smoothly transitions between the two extremes and in effect combines the averaging function with the minimum and maximum functions to provide a unique representation of a set of data.


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