The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 11, 2025

Filed:

Aug. 23, 2023
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Hao Xiang Wu, Beijing, CN;

Rong Zhao, Beijing, CN;

Zhe Yan, Beijing, CN;

Li Li Guan, Beijing, CN;

Li Bo Zhang, Beijing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/23 (2019.01);
U.S. Cl.
CPC ...
G06F 16/2365 (2019.01);
Abstract

An embodiment for detecting anomalous data using dependency modeling. The embodiment may, within a target data environment, identify references between data contained in one or more data files. The embodiment may determine dependency relationships between data fields in the data contained in the one or more data files. The embodiment may construct computational graphs depicting the determined dependency relationships as series of related data fields. The embodiment may identify a series of associated computational graphs within the constructed computational graphs. The embodiment may calculate abnormality degree values for each of the data fields within the constructed computation graphs. The embodiment may, in response to detecting an anomalous data field having a calculated abnormality degree value above a threshold value, calculating contribution values for a series of associated component data fields to identify a root cause for the detected anomalous data field.


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