The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 11, 2025
Filed:
Dec. 08, 2022
Collectivehealth, Inc., San Mateo, CA (US);
Kasey Eunice, Santa Rosa, CA (US);
Roman Kisin, San Jose, CA (US);
CollectiveHealth, Inc., San Mateo, CA (US);
Abstract
A data quality evaluation system can automatically detect one or more types of data anomalies or other data quality issues associated with a data processing system that may impact the quality of output generated by the data processing system. For example, the data quality evaluation system can detect data errors associated with data, detect when data is not received by the data processing system in compliance with defined schedules, detect when elements of the data processing system may be mishandling data, and/or detect when patterns of data does not correspond with historical patterns or validation data. By automatically detecting such data quality issues, technical issues or problems causing the data quality issues can be investigated and corrected.