The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 11, 2025
Filed:
Nov. 03, 2022
International Business Machines Corporation, Armonk, NY (US);
Nianjun Zhou, Chappaqua, NY (US);
Dhavalkumar C. Patel, White Plains, NY (US);
Emmanuel Yashchin, Yorktown Heights, NY (US);
Arun Kwangil Iyengar, Yorktown Heights, NY (US);
Shrey Shrivastava, White Plains, NY (US);
Anuradha Bhamidipaty, Yorktown Heights, NY (US);
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Abstract
Disclosed embodiments provide techniques for estimating imputation algorithm performance. Multiple imputer algorithms are selected, and an evaluation of how well each of the imputer algorithms can estimate the missing data is performed. Disclosed embodiments obtain an imputer candidate dataset (ICD). The imputer candidate dataset is compared to the incomplete data range, and a similarity metric is determined between the data range and the ICD. When the similarity metric exceeds a predetermined threshold, an imputer evaluation dataset (IED) is created from the ICD by removing one or more data points from the ICD. Each imputer algorithm is evaluated by applying the IED to it, and computing an imputer evaluation metric based on its performance. The multiple imputer algorithms are ranked based on the imputer evaluation metric. The best ranked imputer algorithm can then be selected for use on the incomplete data range within the measurement dataset.