The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 11, 2025

Filed:

Feb. 06, 2023
Applicant:

Dell Products L.p., Round Rock, TX (US);

Inventors:

Girish Desai, Fremont, CA (US);

Alex Liu, Fremont, CA (US);

Assignee:

Dell Products L.P., Round Rock, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/07 (2006.01);
U.S. Cl.
CPC ...
G06F 11/0778 (2013.01); G06F 11/0787 (2013.01);
Abstract

A storage device non-fatal error debug system includes a storage device including a storage device chassis, storage device subsystems housed in the storage device chassis, and a non-fatal error debug subsystem provided in the storage device chassis and coupled to each of the storage device subsystems. The non-fatal error debug subsystem provides a counter system for each of a plurality of data path stages performed by the storage device subsystems to provide data path(s) in the storage device, and monitors each counter system during the execution of commands by the storage device subsystems via the performance of the data path stages. When the non-fatal error debug subsystem determines that a counter system provided for a data path stage performed by a storage device subsystem to provide a data path in the storage device indicates a non-fatal error, it collects debug information associated with that data path stage.


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