The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 11, 2025

Filed:

Feb. 18, 2021
Applicant:

Nikon Corporation, Tokyo, JP;

Inventors:

Yosuke Okudaira, Konosu, JP;

Satoshi Yashiki, Chigasaki, JP;

Assignee:

NIKON CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 1/70 (2012.01); G06F 30/398 (2020.01);
U.S. Cl.
CPC ...
G03F 1/70 (2013.01); G06F 30/398 (2020.01);
Abstract

A mask data generation method including: calculating first evaluation value of projection image based on first mask data in which first value or second value different from first value is set for each of a plurality of unit elements that constitute 2-dimensional grid; generating second mask data by changing value of first unit element to which first value is set to second value and by changing value of second unit element which is disposed close to first unit element on 2-dimensional grid and to which second value is set to first value, among the plurality of unit elements included in the first mask data; calculating second evaluation value of projection image based on the second mask data; and comparing the first evaluation value and the second evaluation value and selecting either the first mask data or the second mask data as output mask data based on the comparison result.


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