The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 11, 2025
Filed:
Sep. 22, 2023
Applicant:
Stmicroelectronics S.r.l., Agrate Brianza, IT;
Inventor:
Alberto Pagani, Nova Milanese, IT;
Assignee:
STMicroelectronics S.r.l., Agrate Brianza, IT;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01F 7/06 (2006.01); G01R 1/067 (2006.01); G01R 1/073 (2006.01); G01R 3/00 (2006.01); G01R 31/319 (2006.01);
U.S. Cl.
CPC ...
G01R 3/00 (2013.01); G01R 1/06761 (2013.01); G01R 1/07342 (2013.01); G01R 31/31905 (2013.01); G01R 1/07307 (2013.01); Y10T 29/49002 (2015.01);
Abstract
Cantilever probes are produced for use in a test apparatus of integrated electronic circuits. The probes are configured to contact corresponding terminals of the electronic circuits to be tested during a test operation. The probe bodies are formed of electrically conductive materials. On a lower portion of each probe body that, in use, is directed to the respective terminal to be contacted, an electrically conductive contact region is formed having a first hardness value equal to or greater than 300 HV; each contact region and the respective probe body form the corresponding probe.