The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 11, 2025
Filed:
Mar. 12, 2024
Rohde & Schwarz Gmbh & Co. KG, Munich, DE;
Hendrik Bartko, Unterhaching, DE;
Siewleng Ng, Singapore, SG;
Rohde & Schwarz GmbH & Co. KG, Munich, DE;
Abstract
The invention relates to a method and a system for determining test signals for electromagnetic susceptibility, EMS, testing of a device-under-test, DUT. The method comprises the steps of: receiving at least one DUT parameter which defines a property of the DUT; receiving at least one environmental parameter which defines an electromagnetic environment, EME, in which the DUT is to be used; receiving information on an EM emission behavior, in particular an emission spectrum, of the DUT; and inputting the at least one DUT parameter, the at least one environmental parameter and the information on the EM emission behavior to a machine learning, ML, or artificial intelligence, AI, model. The ML or AI model is configured to determine one or more test signals for EMS testing of the DUT based on the at least one DUT parameter, the at least one environmental parameter and the information on the EM emission behavior.