The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 11, 2025
Filed:
Aug. 01, 2022
New York Society for the Relief of the Ruptured and Crippled, Maintaining the Hospital for Special Surgery, New York, NY (US);
Daniel R. Sturnick, New York, NY (US);
Abstract
A probe is provided and is configured for placement against and for movement along a body of interest and is configured to control and minimize compressive forces induced by the probe on the body of interest. The probe includes a probe handle portion that includes an outer probe housing and a probe head portion that is movably disposed within the outer probe housing. The probe head portion has a first end that defines a contact surface for placement along the body of interest. The probe head portion further has an extension that protrudes outwardly therefrom a second end of the probe head portion that is opposite the first end. The probe has at least one constant force spring that is coupled to the outer probe housing and to the probe head portion and is configured to apply a force to the probe head portion in a distal direction for maintaining the probe in position against a surface of interest during examination thereof, while permitting axial movement of the probe head portion within the outer probe housing. The constant force spring comprises at least one rolled ribbon spring that is wound about at least one pulley that is coupled to the extension of the probe head portion and moves axially together with the probe head portion within and relative to the outer probe housing.