The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 11, 2025

Filed:

Feb. 22, 2023
Applicant:

SK Siltron Co., Ltd., Gumi-si, KR;

Inventor:

Min Jae Yoon, Gumi-si, KR;

Assignee:

SK SILTRON CO., LTD., Gumi-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G01N 25/72 (2006.01); G06T 7/62 (2017.01);
U.S. Cl.
CPC ...
G01N 25/72 (2013.01); G06T 7/0006 (2013.01); G06T 7/62 (2017.01); G06T 2207/30148 (2013.01);
Abstract

An apparatus for growing an ingot from a melt accommodated in a crucible of a chamber comprises a first senor and a controller. The first sensor is installed on one side of the chamber for detecting a detection signal in real time from a side portion of the ingot. The side portion of the ingot rotates via a detection area focused by the first sensor. The controller obtains a detection signal at each of a plurality of sampling points based on detection signals detected in real time, obtains a value of a central point of the ingot based on the detection signal at each of the plurality of sampling points, and determines whether or not the ingot is defective based on the value of the central point of the ingot.


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