The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 11, 2025

Filed:

Mar. 22, 2019
Applicant:

University of Helsinki, Helsingin Yliopisto, FI;

Inventors:

Sasu Tarkoma, Helsingin Yliopisto, FI;

Tuukka Petäjä, Helsingin Yliopisto, FI;

Markku Kulmala, Helsingin Yliopisto, FI;

Joni Kujansuu, Helsingin Yliopisto, FI;

Assignee:

University of Helsinki, Helsingin Yliopisto, FI;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01K 15/00 (2006.01); G08C 23/00 (2006.01);
U.S. Cl.
CPC ...
G01K 15/005 (2013.01); G08C 23/00 (2013.01);
Abstract

A method and apparatus are disclosed for calibrating a first sensor in a changing operating environment by a calibration process. Sensor data are received from the first sensor and sensor values are received from a known calibrating sensor. A sensor specific model is maintained for the first sensor. Calibration needs are detected by estimating a drift and an error, taking into account a difference of sensor values to the known calibrating sensor and further taking into account a sensor profile of the first sensor. A correction factor or a correction model is estimated to the sensor data using said difference and used for calibrating the sensor. The correction factor or the correction model is derived from the sensor specific model.


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