The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 11, 2025

Filed:

Sep. 15, 2020
Applicant:

Koninklijke Philips N.v., Eindhoven, NL;

Inventor:
Assignee:

KONINKLIJKE PHILIPS N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/28 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G01J 3/2823 (2013.01); G01J 3/2803 (2013.01); G06T 7/0012 (2013.01); G01J 2003/2826 (2013.01); G06T 2207/30088 (2013.01);
Abstract

There is provided an apparatus () comprising one or more processors () configured to acquire a multi-/hyperspectral two-dimensional image of an object at respective wavelengths. For at least one pixel of the image corresponding to a first point on an object surface, a set of intensity values for said at least one pixel is compared to a characteristic curve to determine a similarity measure. A first angle of the first point is estimated from the similarity measure or a correction is applied to the image at the first point using the similarity measure. The characteristic curve is a difference between a spectrum of at least one second point on the object surface at a second angle with respect to a plane of the image and a spectrum of at least one third point on the object surface at a third angle with respect to the plane of the image.


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