The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 11, 2025

Filed:

Apr. 08, 2022
Applicant:

Aptiv Technologies Ag, Schaffhausen, CH;

Inventors:

Honghui Yan, Wuppertal, DE;

Alexander Ioffe, Bonn, DE;

Jens Westerhoff, Bochum, DE;

Assignee:

APTIV TECHNOLOGIES AG, Schaffhausen, CH;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 15/02 (2006.01); G01S 13/931 (2020.01);
U.S. Cl.
CPC ...
G01B 15/02 (2013.01); G01S 13/931 (2013.01);
Abstract

A method is disclosed, which is carried out by a detection device having a transmitter element for transmitting wave signals and two vertically aligned receiver elements for receiving wave signals, separated by a given spacing. The method includes transmitting, at the transmitter element, a wave signal that is reflected by the target. Each receiver element receives the wave signal reflected by the target, where the wave signal propagates via multiple paths caused by the reflecting surface. While a target distance varies, a phase difference between the reflected wave signals received by the two receiver elements is measured. From the phase difference measurements, a physical quantity fluctuation is determined in relation to the target distance. The information on the target height is then derived from the physical quantity fluctuation.


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