The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 11, 2025

Filed:

Jun. 15, 2021
Applicant:

Mitsubishi Electric Corporation, Tokyo, JP;

Inventor:

Yasuhiro Toyama, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
F24F 11/38 (2018.01); F24F 11/63 (2018.01);
U.S. Cl.
CPC ...
F24F 11/38 (2018.01); F24F 11/63 (2018.01);
Abstract

The abnormality cause device includes a sensor data acquiring unit for acquiring sensor data from a sensor installed in a target device, an abnormal tendency detecting unit for detecting an abnormal tendency of the sensor data by comparing the sensor data acquired by the sensor data acquiring unit with a normal model showing a normal value range of the sensor data, and an abnormality cause estimating unit for estimating an abnormality cause of the target device by comparing the abnormal tendency detected by the abnormal tendency detecting unit with an abnormality cause model in which an abnormal tendency of past sensor data and an abnormality cause of the target device are associated with each other.


Find Patent Forward Citations

Toyama, Yasuhiro. (2025). Abnormality cause estimation device, abnormality cause estimation method, and medium (U.S. Patent No. 12247752). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12247752

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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