The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 11, 2025
Filed:
Jun. 25, 2021
Qvella Corporation, Richmond Hill, CA;
Samad Talebpour, Richmond Hill, CA;
Anna Khimchenko, Thornhill, CA;
Maryam Asadishekari, Vaughan, CA;
Stephen Wesley Leonard, Markham, CA;
Abstract
Systems and methods are provided for classifying microbial cells according to morphological features of microcolonies. A dark-field objective is employed to acquire a dark-field image of a microcolony during a microcolony growth phase that is characterized by phenotypic expression of microcolony morphological features which evolve with time and are differentiated among classes of microbial cell types. The dark-field image is processed to classify the microcolony according to two or more microbial cell types, such as Gram status and/or speciation. The dark-field objective may have a numerical aperture selected to facilitate the imaging of microcolony morphological features, residing, for example, between 0.15 and 0.35. A set of dark-field images of a microcolony may be collected during the microcolony growth phase and processed to classify the microcolony. Classification may be performed according to a temporal ordering of the dark-field images, for example, using a recurrent neural network.