The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 11, 2025
Filed:
May. 19, 2021
Daniel R. Neal, Tijeras, NM (US);
R. James Copland, Albuquerque, NM (US);
Xifeng Xiao, Albuquerque, NM (US);
Alan Blair, Albuquerque, NM (US);
Daniel R. Neal, Tijeras, NM (US);
R. James Copland, Albuquerque, NM (US);
Xifeng Xiao, Albuquerque, NM (US);
Alan Blair, Albuquerque, NM (US);
WaveFront Dynamics, Inc., Albuquerque, NM (US);
Abstract
A method and system for correcting vision in an eye that uses a wavefront-customized phakic or pseudophakic Intraocular Lens (IOL), the method comprising: (1) measuring wavefront aberrations of the eye; (2) designing a wavefront-customized correction profile for an IOL; (3) creating a customized IOL with the customized correction profile; and (4) implanting the customized IOL in the eye, without having to remove the natural lens. Alternatively, an uncorrected IOL is implanted first, followed by scanning a femtosecond laser spot across the implanted IOL to locally change the Index of Refraction of the IOL material and create an in-situ customized IOL.