The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 11, 2025
Filed:
Oct. 04, 2021
Esaote S.p.a., Genoa, IT;
Stefano De Beni, Genoa, IT;
Marco Crocco, Ovada, IT;
Esaote S.p.A., Genoa, IT;
Abstract
A method and system for two-dimensional shear wave elastography imaging (SWEI) that acquires B-mode ultrasound image of a region, selects an area of the B-mode image, automatically acquires two-dimensional shear wave elastography imaging data related to the selected area, and displays elasticity/velocity map on the selected area and optionally a reliability map. An algorithm takes as input one or combination of data sets selected from B-mode raw data or B-mode image data or elasticity/velocity map or reliability map or—raw two-dimensional shear wave elastography imaging data inside selected area, or two-dimensional shear wave elastography imaging data at an intermediate stage of processing like displacement curves over time or their peak features, and outputs the 2D coordinate of measure ROI center. Measure ROI overlapped on the B-mode image and/or on the elasticity map and/or on the reliability map is displayed. An elasticity parameter inside the measure ROI is computed, optionally weighted, and displayed.