The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 11, 2025
Filed:
Jul. 12, 2021
Murata Manufacturing Co., Ltd., Nagaokakyo, JP;
Jun Takagi, Nagaokakyo, JP;
Tomoki Takahashi, Nagaokakyo, JP;
Hiroaki Togashi, Nagaokakyo, JP;
Kenji Tanaka, Nagaokakyo, JP;
MURATA MANUFACTURING CO., LTD., Nagaokakyo, JP;
Abstract
A measuring device is provided with an improved contact property of a measuring surface of a sensor with respect to a surface of a target object. The measuring device includes a main body and a probe that has a head section at the distal end thereof and an arm section connecting the head section to the main body. The head section has a support portion, a measuring portion, and a coupling portion. The support portion is connected to the distal end of the arm section. The measuring portion has a first surface at which a measuring surface of a sensor is exposed and a thickness with the first surface as a datum plane. The coupling portion is disposed between and couples the measuring portion and the support portion. The coupling portion has a first connection portion connected to the measuring portion and a through hole.