The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 11, 2025

Filed:

Apr. 05, 2019
Applicant:

Sony Corporation, Tokyo, JP;

Inventor:

Yoshihiro Wakita, Tokyo, JP;

Assignee:

SONY CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/47 (2006.01); A61B 5/026 (2006.01); G01P 3/36 (2006.01); G01P 5/26 (2006.01);
U.S. Cl.
CPC ...
A61B 5/0261 (2013.01); G01N 21/47 (2013.01); G01P 3/366 (2013.01); G01P 5/26 (2013.01);
Abstract

There is provided a scattered light signal measurement apparatus and an information processing apparatus that are capable of performing accurate measurement while preventing noise due to changes in relative velocity and relative position caused between a sensor and an observation target. The scattered light signal measurement apparatus includes a light receiving element and an incident angle limiting unit. The light receiving element receives scattered light obtained when coherent light emitted to a measurement target is scattered by the measurement target. The incident angle limiting unit limits an incident angle of the scattered light that is incident on a single point of the light receiving element to be equal to or smaller than a predetermined angle and controls the single light receiving element to increase an aperture ratio.


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