The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 11, 2025
Filed:
Sep. 27, 2021
Hoya Lens Thailand Ltd., Pathumthani, TH;
Takashi Iizuka, Tokyo, JP;
HOYA LENS THAILAND LTD., Pathumthani, TH;
Abstract
A refraction measuring apparatus measures refractive properties of an eye by two light bundles respectively passing through two apertures, the apparatus including: a first rotational member, rotatably supported about a first rotational center, provided with the two apertures on either side of the first rotational center; a second rotational member, rotatably supported about a second rotational center, provided with a light-transmission portion(s) and a light-shielding portion at different rotational-direction positions. When the first rotational member is rotated, the second rotational member rotates, and while an aperture arrangement direction of the two apertures changes in accordance with the rotation of the second rotational member, a light-transmission state is entered, in which the light-transmission portion coincides with the two apertures to allow the two light bundles to pass through, or a light-shielding state is entered, in which the light-shielding portion coincides with the two apertures to shield the two light bundles.