The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 04, 2025
Filed:
Apr. 01, 2022
Samsung Electronics Co., Ltd., Suwon-si, KR;
Dalin Zhu, Richardson, TX (US);
Eko Onggosanusi, Coppell, TX (US);
Samsung Electronics Co., Ltd., Suwon-si, KR;
Abstract
Methods and apparatuses for channel and interference measurement in a wireless communication system. A method for operating a user equipment (UE) includes receiving a reporting setting and receiving a resource setting associated with the reporting setting. The reporting setting is configured with a higher layer parameter reportQuantity that is set to at least cri-SINR. The resource setting is configured with a higher layer parameter resourceType that is set to aperiodic, periodic, or semi-persistent. The method further includes receiving a first set of reference signals (RSs) through a first set of RS resources; receiving a second set of RSs through a second set of RS resources; measuring at least one RS in the first or second sets of RSs; and determining, based on the reporting setting and the measured at least one RS, one or more layer-1 signal-to-noise and interference ratios (L1-SINRs).