The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 04, 2025

Filed:

Jan. 15, 2021
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Jung Ho Ryu, Fort Lee, NJ (US);

Sony Akkarakaran, Poway, CA (US);

Tao Luo, San Diego, CA (US);

Junyi Li, Franklin Park, NJ (US);

Ling Ding, Chester, NJ (US);

Jelena Damnjanovic, Del Mar, CA (US);

Juan Montojo, San Diego, CA (US);

Kapil Gulati, Belle Mead, NJ (US);

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04W 24/10 (2009.01); H04W 24/08 (2009.01);
U.S. Cl.
CPC ...
H04W 24/10 (2013.01); H04W 24/08 (2013.01);
Abstract

Aspects described herein relate to determining and/or scheduling resources for devices in view of cross-channel interference measured between the devices. In an aspect, a first user equipment (UE) can determine a signal measurement of a signal transmitted by a second UE in a first channel, determine, based at least in part on the signal measurement, a cross-channel interference parameter of interference experienced by the first UE, and transmit, to a serving base station that serves the first UE, an indication of the cross-channel interference parameter. In another aspect, a base station can determine a cross-channel interference parameter of interference experienced by a first UE in at least a first channel, based on a signal transmitted by a second UE in a second channel, and can schedule communications for the first UE based at least in part on the cross-channel interference parameter.


Find Patent Forward Citations

Quick Actions:

Ryu, Jung. (2025). Techniques for cross-channel interference measurement in wireless communications (U.S. Patent No. 12245064). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12245064

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