The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 04, 2025

Filed:

Jan. 29, 2020
Applicant:

Institut National DE LA Recherche Scientifique, Québec, CA;

Inventors:

Jinyang Liang, Boucherville, CA;

Xianglei Liu, Longueuil, CA;

Fiorenzo Vetrone, Montréal, CA;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04N 25/77 (2023.01); G01J 11/00 (2006.01); G01N 21/64 (2006.01); H04N 23/60 (2023.01);
U.S. Cl.
CPC ...
H04N 25/77 (2023.01); G01J 11/00 (2013.01); G01N 21/6408 (2013.01); G01J 2011/005 (2013.01); H04N 23/60 (2023.01);
Abstract

A system and a method for single-shot compressed optical-streaking ultra-high-speed imaging, the system comprising a spatial encoding module spatially encoding the transient event with a binary pseudo-random pattern into spatially encoded frames; a galvanometer scanner temporally shearing the spatially encoded frames; and a CMOS camera receiving the temporally sheared spatially encoded frames, during one exposure time of the camera, for reconstructing the transient event. The method comprises spatial encoding a transient event; temporal shearing resulting spatially encoded frames of the event, spatio-temporal integration, and reconstruction.


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