The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 04, 2025

Filed:

Jan. 17, 2023
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventors:

Hitoshi Sakurabu, Saitama, JP;

Hideaki Kokubun, Saitama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 23/67 (2023.01); G02B 7/04 (2021.01); G03B 13/36 (2021.01); G06V 10/25 (2022.01); G06V 10/74 (2022.01);
U.S. Cl.
CPC ...
H04N 23/675 (2023.01); G02B 7/04 (2013.01); G03B 13/36 (2013.01); G06V 10/25 (2022.01); G06V 10/761 (2022.01);
Abstract

A selection method includes a first imaging step of imaging a subject included in a plurality of candidate regions including a first region and a plurality of second regions, a first calculation step of calculating a first distance, which is a distance of a first subject in the first region, and a plurality of second distances, which are distances of a plurality of second subjects in the plurality of second regions, a first specifying step of specifying a first specific region, which corresponds to the second distance satisfying a first condition, from among the plurality of second regions, and a first selection step of selecting a first in-focus subject, which is to be focused, from among the first subject and the second subject in the first specific region based on a first ratio which is a ratio of the first specific region to the plurality of second regions.


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