The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 04, 2025

Filed:

Jul. 05, 2023
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Yasutaka Serizawa, Tokyo, JP;

Hisanori Matsumoto, Tokyo, JP;

Goichi Ono, Tokyo, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 20/52 (2022.01); G06T 7/80 (2017.01); H04N 13/296 (2018.01);
U.S. Cl.
CPC ...
H04N 13/296 (2018.05); G06T 7/85 (2017.01); G06V 20/52 (2022.01); G06T 2207/30232 (2013.01); G06T 2207/30244 (2013.01);
Abstract

The state monitoring system includes: a 3D camera configured to acquire an image in a work area; and information processing apparatus connected to the 3D camera and including a processing unit and a storage unit. The processing unit calculates a camera setting parameter that determines an imaging condition of the 3D camera with respect to a monitoring target as a target to be monitored in the work area and stores the camera setting parameter in the storage unit, determines the imaging condition of the 3D camera by applying the camera setting parameter corresponding to the monitoring target with reference to the camera setting parameter stored in the storage unit, acquires an image of the monitoring target from the 3D camera configured to image the monitoring target in the determined imaging condition, and determines a state of the monitoring target based on the acquired image of the monitoring target.


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