The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 04, 2025
Filed:
Oct. 04, 2022
Bull Sas, Les Clayes-sous-bois, FR;
Amarnath Chatterjee, Bangalore, IN;
Rajat Mohanty, Fairfax, VA (US);
BULL SAS, Les Clayes-sous-Bois, FR;
Abstract
A method for detecting outliers in processes running in a group of machines. A clustering stage, carried out at a first frequency, including fetching a list of software contained in all machines, calculating tf-idf value for each installed software and for each machine, performing clustering of the machines by applying a clustering algorithm and using a Jaccardian weighted distance method between machines based on the tf-idf values. A preliminary outliers detection stage, carried out at a second frequency greater than the first frequency, including fetching information of processes running in the machines, for each cluster calculating tf-idf values for each process, wherein if a tf-idf value is greater than a first predetermined threshold, the process is considered as outlier, for all clusters calculating itf-idf value for each process considered as outlier, and if a itf-idf value is lower than a second predetermined threshold, the process is confirmed as outlier.