The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 04, 2025

Filed:

Apr. 07, 2020
Applicant:

Nec Corporation, Tokyo, JP;

Inventor:

Yoshiaki Nishikawa, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B 17/391 (2015.01); H04B 17/309 (2015.01); H04B 17/327 (2015.01); H04W 4/02 (2018.01); H04W 4/021 (2018.01); H04W 4/029 (2018.01); H04W 4/38 (2018.01); H04W 4/60 (2018.01);
U.S. Cl.
CPC ...
H04B 17/391 (2015.01); H04B 17/327 (2015.01); H04W 4/023 (2013.01); H04W 4/029 (2018.02);
Abstract

A spatial data creating apparatus receives, the data for estimation being used to create spatial data that associate a location of a target area with value relating the location based on data acquired from a first group of sensors, the data for evaluation being acquired from a second group of sensors installed at a different location(s), classifies the data for evaluation based on difference between the data for evaluation and the value of the spatial data, creates subspace data that forms a part of the spatial data using data acquired from the first group of sensors selected based on the location(s) at which the data for evaluation is acquired, the location(s) being classified by the data classifying part among the data for estimation, determines whether or not the subspace data is adopted by comparing the subspace data with the data for evaluation.


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