The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 04, 2025
Filed:
Jan. 06, 2023
Samsung Display Co., Ltd., Yongin-si, KR;
Min-Hong Kim, Gyeonggi-do, KR;
Taejoon Kim, Seongnam-si, KR;
Jungmok Park, Hwaseong-si, KR;
Bogeun Yuk, Hwaseong-si, KR;
Hyun-Wook Cho, Yongin-si, KR;
SAMSUNG DISPLAY CO., LTD., Yongin-si, KR;
Abstract
Disclosed is an apparatus for inspecting a defect of a display panel. The apparatus for inspecting includes the display panel that displays an image, an input sensor that is disposed on the display panel and senses an input applied from outside, a sensor driving part that drives the input sensor, and an inspection part that is connected with the sensor driving part, sets a frequency of the input sensor to an inspection frequency, and detects the defect of the display panel based on a change in a jitter occurring when the input sensor is driven at the inspection frequency. The inspection frequency includes a harmonic frequency of a driving frequency of the display panel.