The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 04, 2025

Filed:

Mar. 14, 2022
Applicants:

Meidensha Corporation, Tokyo, JP;

Japan Automobile Research Institute, Tokyo, JP;

Inventors:

Toshimichi Takahashi, Tokyo, JP;

Kenji Watanabe, Tokyo, JP;

Tomoya Nakajo, Tsukuba, JP;

Motoaki Oyama, Tsukuba, JP;

Takahiro Haniu, Tsukuba, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/30 (2006.01); G01M 99/00 (2011.01); G06F 16/27 (2019.01); G07C 5/08 (2006.01);
U.S. Cl.
CPC ...
G07C 5/0808 (2013.01); G01M 99/005 (2013.01); G06F 16/27 (2019.01);
Abstract

A measurement data synchronization method for synchronizing, through use of a data analysis apparatus, time series outputted from first through fifth measuring instruments, includes a step STfor acquiring first through fifth reference data outputted from the first through fifth measuring instruments when a reference signal including a stationary interval and a rising interval is inputted to the measuring instruments simultaneously, steps ST-STfor generating first through fifth filter processed data by applying median filter processing to the first through fifth reference data to extract the median value in a prescribed duration, a step STfor calculating first through fifth rising times as timing information of rising from each of the first through fifth filter processed data, and a step STfor synchronizing first through fifth measurement data outputted from the measuring instruments on the basis of the first through fifth rising times.


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Takahashi, Toshimichi. (2025). Measurement data synchronization method, testing method, and non-transitory computer-readable medium storing computer program (U.S. Patent No. 12243361). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12243361

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