The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 04, 2025

Filed:

Apr. 29, 2022
Applicant:

Toyota Research Institute, Inc., Los Altos, CA (US);

Inventors:

Jie Li, Ann Arbor, MI (US);

Vitor Guizilini, Santa Clara, CA (US);

Adrien Gaidon, San Jose, CA (US);

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 20/58 (2022.01); G06T 7/50 (2017.01); G06T 7/80 (2017.01);
U.S. Cl.
CPC ...
G06V 20/58 (2022.01); G06T 7/50 (2017.01); G06T 7/80 (2017.01);
Abstract

A method for self-calibrating alignment between image data and point cloud data utilizing a machine learning model includes receiving, with an electronic control unit, image data from a vision sensor and point cloud data from a depth sensor, implementing, with the electronic control unit, a machine learning model trained to: align the point cloud data and the image data based on a current calibration, detect a difference in alignment of the point cloud data and the image data, adjust the current calibration based on the difference in alignment, and output a calibrated embedding feature map based on adjustments to the current calibration.


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