The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 04, 2025

Filed:

Feb. 20, 2020
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Yu Nabeto, Tokyo, JP;

Katsumi Kikuchi, Tokyo, JP;

Soma Shiraishi, Tokyo, JP;

Takami Sato, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06V 20/50 (2022.01); G06T 7/62 (2017.01); G06V 10/12 (2022.01); G06V 10/22 (2022.01);
U.S. Cl.
CPC ...
G06V 20/50 (2022.01); G06V 10/12 (2022.01); G06V 10/22 (2022.01);
Abstract

An article determination apparatus () is used with two image capture units (). One image capture unit (), an article shelf (), and the other image capture unit () are arranged in this order. The acquisition unit () acquires images generated by the two image capture units (). The image processing unit () generates first size data and second size data by processing the images acquired by the acquisition unit (). The first size data and the second size data indicate the size of an area in which an article is captured in an image generated by one image capture unit () and by the other image capture unit (), respectively. The determination unit () determines that an estimation result of the article name of the article by image processing is correct when a relation between the first size data and the second size data satisfies a criterion.


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