The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 04, 2025

Filed:

Apr. 27, 2022
Applicant:

Niantic, Inc., San Francisco, CA (US);

Inventors:

Dung Anh Doan, Prospect, AU;

Daniyar Turmukhambetov, London, GB;

Soohyun Bae, Los Gatos, CA (US);

Assignee:

Niantic, Inc., San Francisco, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 20/50 (2022.01); G06T 7/73 (2017.01); G06V 10/774 (2022.01); G06V 20/90 (2022.01);
U.S. Cl.
CPC ...
G06V 20/50 (2022.01); G06T 7/74 (2017.01); G06V 10/774 (2022.01); G06V 20/90 (2022.01); G06T 2207/10016 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/30244 (2013.01);
Abstract

The present disclosure describes approaches for evaluating interest points for localization uses based on a repeatability of the detection of the interest point in images capturing a scene that includes the interest point. The repeatability of interest points is determined by using a trained repeatability model. The repeatability model is trained by analyzing a time series of images of a scene and determining repeatability functions for each interest point in the scene. The repeatability function is determined by identifying which images in the time series of images allowed for the detection of the interest point by an interest point detection model.


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