The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 04, 2025

Filed:

Jan. 03, 2023
Applicant:

Cape Analytics, Inc., Palo Alto, CA (US);

Inventor:

Peter Lorenzen, Palo Alto, CA (US);

Assignee:

Cape Analytics, Inc., Palo Alto, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06V 20/00 (2022.01); G06F 18/2413 (2023.01); G06V 10/44 (2022.01); G06V 10/764 (2022.01); G06V 10/82 (2022.01); G06V 20/10 (2022.01); H04N 23/11 (2023.01);
U.S. Cl.
CPC ...
G06V 20/176 (2022.01); G06F 18/2413 (2023.01); G06V 10/451 (2022.01); G06V 10/764 (2022.01); G06V 10/82 (2022.01); H04N 23/11 (2023.01);
Abstract

Disclosed systems and methods relate to remote sensing, deep learning, and object detection. Some embodiments relate to machine learning for object detection, which includes, for example, identifying a class of pixel in a target image and generating a label image based on a parameter set. Other embodiments relate to machine learning for geometry extraction, which includes, for example, determining heights of one or more regions in a target image and determining a geometric object property in a target image. Yet other embodiments relate to machine learning for alignment, which includes, for example, aligning images via direct or indirect estimation of transformation parameters.


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