The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 04, 2025

Filed:

Dec. 20, 2021
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Srenivas Varadarajan, Karnataka, IN;

Anamika Sharma, Madhya Pradesh, IN;

Yohan Roh, Suwon-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 10/80 (2022.01); G06T 7/246 (2017.01); G06T 7/73 (2017.01);
U.S. Cl.
CPC ...
G06V 10/80 (2022.01); G06T 7/246 (2017.01); G06T 7/73 (2017.01);
Abstract

The embodiments herein provide a method of obtaining a weighted combination of dynamic vision sensor (DVS) measurements and contact image sensor (CIS) measurements for determining visual inference in an electronic device, the method includes receiving, by the electronic device, a DVS image and a CIS image from the image sensor; determining, by the electronic device, a plurality of parameters associated with the DVS image and feature velocities of a plurality of CIS features present in the CIS image; determining, by the electronic device, a determined DVS feature confidence based on the plurality of parameters associated with the DVS image; determining, by the electronic device, a determined CIS feature confidence based on the feature velocities of the plurality of features present in the CIS image; and calculating, by the electronic device, a weighted visual inference based on the determined DVS feature confidence and the determined CIS feature confidence.


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