The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 04, 2025

Filed:

Sep. 21, 2023
Applicant:

Tencent America Llc, Palo Alto, CA (US);

Inventors:

Thuong Nguyen Canh, San Benito, CA (US);

Xiaozhong Xu, State College, PA (US);

Shan Liu, San Jose, CA (US);

Fang-Yi Chao, Palo Alto, CA (US);

Assignee:

TENCENT AMERICA LLC, Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 9/00 (2006.01); H04N 19/117 (2014.01); H04N 19/124 (2014.01); H04N 19/136 (2014.01); H04N 19/61 (2014.01);
U.S. Cl.
CPC ...
G06T 9/001 (2013.01); H04N 19/117 (2014.11); H04N 19/124 (2014.11); H04N 19/136 (2014.11); H04N 19/61 (2014.11);
Abstract

A method performed by at least one processor of an encoder comprises: performing, on an input 3D mesh, a symmetry detection process to estimate a partition plane. The method further comprises partitioning the input 3D mesh into a first side and a second side based on the partition plane, where the first side is opposite to the second side, and where a first vertex on the first side is symmetric to a second vertex on the second side. The method further comprises quantizing the first vertex and the second vertex in pairs to reduce a quantization error and symmetry prediction error associated with the first vertex and the second vertex.


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