The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 04, 2025

Filed:

Feb. 28, 2022
Applicant:

Kabushiki Kaisha Toshiba, Tokyo, JP;

Inventors:

Nao Mishima, Tokyo, JP;

Akihito Seki, Yokohama Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/55 (2017.01); G06V 10/774 (2022.01); G06V 10/776 (2022.01);
U.S. Cl.
CPC ...
G06T 7/55 (2017.01); G06V 10/774 (2022.01); G06V 10/776 (2022.01); G06T 2207/10028 (2013.01); G06T 2207/20081 (2013.01);
Abstract

According to one embodiment, a learning method includes acquiring first multi-view images obtained by capturing a first subject and causing a statistical model to learn, based on first and second bokeh values output from the statistical model by inputting first and second images of the first multi-view images. The causing includes acquiring a first distance from the capture device to a first subject in the first image and a second distance from the capture device to a first subject in the second image, discriminating a relationship in length between the first and second distances, and causing the statistical model to learn such that a relationship in magnitude between the first and second bokeh values is equal to the discriminated relationship.


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