The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 04, 2025

Filed:

Jun. 01, 2022
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventor:

Hiroaki Yamamoto, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02091 (2022.01); G01B 9/021 (2006.01); G06T 11/00 (2006.01); H04N 23/56 (2023.01);
U.S. Cl.
CPC ...
G06T 11/005 (2013.01); G01B 9/02091 (2013.01); G01B 9/021 (2013.01); G06T 11/006 (2013.01); H04N 23/56 (2023.01);
Abstract

A control device includes a processor. The processor acquires positional information indicating a position of an observation target. The processor sets, from among a plurality of irradiation positions, a required irradiation position, which is an irradiation position corresponding to the position of the observation target indicated by the positional information and is an irradiation position required for obtaining a plurality of the interference fringe images that are sources of a super-resolution interference fringe image having a resolution exceeding a resolution of an imaging element. The processor causes a light source to emit an illumination light from the required irradiation position by controlling an operation of the light source, and causes the imaging element to outputs the interference fringe image at each required irradiation position.


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