The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 04, 2025
Filed:
Sep. 17, 2020
Applicant:
Samsung Electronics Co., Ltd., Suwon-si, KR;
Inventor:
Jaeyeon Kim, Suwon-si, KR;
Assignee:
Samsung Electronics Co., Ltd., Suwon-si, KR;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 3/082 (2023.01); G06F 9/48 (2006.01); G06F 9/50 (2006.01); G06F 18/20 (2023.01); G06F 18/213 (2023.01); G06F 18/22 (2023.01); G06N 3/08 (2023.01);
U.S. Cl.
CPC ...
G06N 3/082 (2013.01); G06F 9/5066 (2013.01); G06F 18/213 (2023.01); G06F 18/22 (2023.01); G06F 18/285 (2023.01); G06N 3/08 (2013.01); G06F 9/4881 (2013.01); G06F 2209/501 (2013.01);
Abstract
A parallel processing method and apparatus for a neural network model. The parallel processing method includes extracting metadata of a target layer included in a target model, measuring a similarity between the target layer and each of reference layers by comparing the metadata of the target layer to reference metadata of each of the reference layers, selecting a corresponding layer among the reference layers based on the similarities, and generating a parallelization strategy for the target layer based on a reference parallelization strategy matching the corresponding layer.