The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 04, 2025

Filed:

Aug. 04, 2023
Applicant:

Visa International Service Association, San Francisco, CA (US);

Inventors:

Kwei-Herng Lai, Houston, TX (US);

Lan Wang, Sunnyvale, CA (US);

Huiyuan Chen, San Jose, CA (US);

Mangesh Bendre, Sunnyvale, CA (US);

Mahashweta Das, Campbell, CA (US);

Hao Yang, San Jose, CA (US);

Assignee:

Visa International Service Association, San Francisco, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01); G06F 18/2413 (2023.01);
U.S. Cl.
CPC ...
G06N 20/00 (2019.01); G06F 18/24147 (2023.01);
Abstract

Methods, systems, and computer program products may formulate an iterative data mix up problem into a Markov decision process (MDP) with a tailored reward signal to guide a learning process. To solve the MDP, a deep deterministic actor-critic framework may be modified to adapt a discrete-continuous decision space for training a data augmentation policy.


Find Patent Forward Citations

Lai, Kwei-Herng. (2025). Method, system, and computer program product for synthetic oversampling for boosting supervised anomaly detection (U.S. Patent No. 12242939). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12242939

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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