The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 04, 2025
Filed:
Sep. 03, 2020
Mitsubishi Electric Corporation, Tokyo, JP;
Takeshi Takeuchi, Tokyo, JP;
Tomoharu Takeuchi, Tokyo, JP;
Mitsubishi Electric Corporation, Tokyo, JP;
Abstract
A device analysis apparatus includes: an operation data storage unit storing operation data indicating an operation state of a device; a feature quantity data generation unit generating feature quantity data of the device by using the operation data; a feature quantity data storage unit storing the feature quantity data; a first computation unit generating first data indicating behavior of the feature quantity data in units of a set term by using the feature quantity data stored in the feature quantity data storage unit; a second computation unit generating second data indicating behavior of latest feature quantity data by using one or more pieces of the latest feature quantity data newer than the feature quantity data used in generating the first data, among the feature quantity data stored in the feature quantity data storage unit; and a display unit displaying the first data and the second data in one graph.