The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 04, 2025

Filed:

Dec. 14, 2022
Applicant:

Here Global B.v., Eindhoven, NL;

Inventors:

Qi Mao, Arlington, TX (US);

Zhenhua Zhang, Chicago, IL (US);

Assignee:

HERE GLOBAL B.V., Eindhoven, NL;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01); G06F 16/29 (2019.01); G06F 16/901 (2019.01); G06F 18/213 (2023.01); G06F 18/231 (2023.01); G06F 18/24 (2023.01);
U.S. Cl.
CPC ...
G06F 16/29 (2019.01); G06F 16/9024 (2019.01); G06F 18/213 (2023.01); G06F 18/231 (2023.01); G06F 18/24 (2023.01);
Abstract

An approach is provided for linear feature detection of cartographic features. The approach, for example, involves receiving a plurality of linear feature detections that represent one or more linear features of a geographic environment and are detected using at least one sensor. The approach also involves clustering the plurality of linear feature detections into at least one cluster and determining that the at least one cluster forms a polygon. The approach further involves cutting the polygon at one or more cut locations to form a plurality of sub-clusters of the plurality of linear feature detections. The approach further involves extracting respective centerlines for the plurality of sub-clusters and connecting the respective centerlines at the one or more cut locations to generate a network graph of the one or more linear features.


Find Patent Forward Citations

Mao, Qi. (2025). Method, apparatus, and system for providing linear feature detection of cartographic features (U.S. Patent No. 12242519). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12242519

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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