The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 04, 2025

Filed:

Nov. 02, 2021
Applicant:

View, Inc., Milpitas, CA (US);

Inventors:

Mark Kozlowski, Windsor, CA (US);

Eric W. Kurman, Healdsburg, CA (US);

Zhongchun Wang, Milpitas, CA (US);

Mike Scobey, Santa Rosa, CA (US);

Jeremy A. Dixon, Olive Branch, MS (US);

Anshu A Pradhan, Collierville, TN (US);

Robert T. Rozbicki, Saratoga, CA (US);

Assignee:

View, Inc., San Jose, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02F 1/1524 (2019.01); C09K 9/00 (2006.01); C23C 14/08 (2006.01); C23C 14/14 (2006.01); C23C 14/34 (2006.01); C23C 14/56 (2006.01); C23C 14/58 (2006.01); G02F 1/1523 (2019.01); G02F 1/153 (2006.01); G02F 1/155 (2006.01); B05D 5/06 (2006.01); B23K 20/10 (2006.01); C03C 17/34 (2006.01); C23C 10/28 (2006.01); C23C 14/02 (2006.01); C23C 14/04 (2006.01); C23C 14/18 (2006.01);
U.S. Cl.
CPC ...
G02F 1/1533 (2013.01); C09K 9/00 (2013.01); G02F 1/1523 (2013.01); G02F 1/1524 (2019.01); G02F 1/1525 (2013.01); G02F 1/155 (2013.01); B05D 5/06 (2013.01); B23K 20/10 (2013.01); C03C 17/3417 (2013.01); C03C 2217/94 (2013.01); C09K 2211/183 (2013.01); C09K 2211/187 (2013.01); C23C 10/28 (2013.01); C23C 14/021 (2013.01); C23C 14/022 (2013.01); C23C 14/024 (2013.01); C23C 14/046 (2013.01); C23C 14/08 (2013.01); C23C 14/083 (2013.01); C23C 14/085 (2013.01); C23C 14/086 (2013.01); C23C 14/14 (2013.01); C23C 14/185 (2013.01); C23C 14/3407 (2013.01); C23C 14/568 (2013.01); C23C 14/58 (2013.01); C23C 14/5806 (2013.01); C23C 14/5853 (2013.01); G02F 1/153 (2013.01); G02F 2001/1536 (2013.01);
Abstract

Prior electrochromic devices frequently suffer from high levels of defectivity. The defects may be manifest as pin holes or spots where the electrochromic transition is impaired. This is unacceptable for many applications such as electrochromic architectural glass. Improved electrochromic devices with low defectivity can be fabricated by depositing certain layered components of the electrochromic device in a single integrated deposition system. While these layers are being deposited and/or treated on a substrate, for example a glass window, the substrate never leaves a controlled ambient environment, for example a low pressure controlled atmosphere having very low levels of particles. These layers may be deposited using physical vapor deposition.


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