The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 04, 2025
Filed:
Jun. 12, 2020
The University of Nottingham, Nottingham, GB;
University of Vienna, Viennna, AT;
Ivette Fuentes Guridi, Nottingham, GB;
Dennis Rätzel, Vienna, AT;
Tupac Bravo Ibarra, Vienna, AT;
David Edward Bruschi, Nottingham, GB;
The University of Nottingham, Nottingham, GB;
University of Vienna, Vienna, AT;
Abstract
A method of measuring an acceleration using one or more trapped BECs and at least two atomic field modes within those BECs is described. A density distribution of at least one of the one or more BECs is modified by the acceleration, which leads to a change of the field modes' time evolution. The method comprises: selecting two modes that are differently affected by the acceleration; and measuring the acceleration-induced difference; and using the measured acceleration-induced difference to infer the acceleration. Also described is a method of measuring a field gradient using one or more trapped BECs. Each of the trapped BECs has a density distribution, and at least two atomic modes within those BECs, wherein the density distributions of the one or more BECs are modified by the field, which leads to a change of the atomic modes' time evolution. The method comprises selecting two atomic modes that are differently affected by the field; and measuring a field-induced difference between the selected atomic modes; and using the measured field-induced difference to infer a gradient of the field.