The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 04, 2025

Filed:

Oct. 20, 2021
Applicant:

China University of Mining & Technology, Beijing, Beijing, CN;

Inventors:

Peng Lin, Beijing, CN;

Jingtao Zhao, Beijing, CN;

Suping Peng, Beijing, CN;

Xiaoqin Cui, Beijing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 1/36 (2006.01); G01V 1/30 (2006.01); G01V 1/34 (2006.01);
U.S. Cl.
CPC ...
G01V 1/362 (2013.01); G01V 1/301 (2013.01); G01V 1/306 (2013.01); G01V 1/34 (2013.01);
Abstract

The present disclosure provides a small-scale geological anomalous body detection method and device, and relates to the field of small-scale geological anomalous body detection. The method comprises: acquiring diffracted wave shot-gather data collected in a to-be-processed area and determining target single shot data having a distance to the center point, which is a predetermined distance; calculating a first horizontal distance between each shot point in the target single shot data and the center point and calculating a second horizontal distance between the detection point corresponding to each shot point and the center point; constructing a common-diffraction-point gather based on the first horizontal distances and the second horizontal distances; and processing the common-diffraction-point gather by using a correction algorithm of diffracted wave events to obtain a diffracted wave imaging profile.


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