The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 04, 2025

Filed:

Mar. 14, 2023
Applicant:

Tdk Corporation, Tokyo, JP;

Inventors:

Shotaro Hamamoto, Tokyo, JP;

Masataka Midori, Tokyo, JP;

Hiroshi Kurihara, Tokyo, JP;

Assignee:

TDK CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2862 (2013.01);
Abstract

A electromagnetic wave test device includes: a reverberation chamber; a first antenna installed inside the chamber and radiating electromagnetic waves of a frequency lower than the chamber's first resonance frequency; a second antenna installed inside the chamber and radiating electromagnetic waves of a frequency equal to or higher than first resonance frequency; a power supply device connected between a grounding member and first antenna and feeding power to the first antenna; a dummy load connected between the grounding member and first antenna; a first power loss inhibiting unit having an impedance corresponding to an allowed value for power loss according to first antenna in a case wherein electromagnetic waves are radiated from the second antenna; and a switching unit including a first switching unit that switches a connection destination of first antenna to one of the dummy load and the first power loss inhibiting unit.


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