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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12241905 B1

PDFFull Text
Date of Patent:
Mar. 04, 2025

Filed:

Feb. 04, 2020

Automatic analysis device and automatic analysis method

Applicant:

Hitachi High-tech Corporation, Tokyo, JP;

Inventors:

Kohei Hiroki, Tokyo, JP;

Akihiro Yasui, Tokyo, JP;

Takeshi Setomaru, Tokyo, JP;

Assignee:

HITACHI HIGH-TECH CORPORATION, Tokyo, JP;

Attorney:

MATTINGLY & MALUR, PC

Primary Examiner:

Jennifer Wecker

Assistant Examiner:

Oyeleye Alexander Alabi

Int. Cl.
CPC ...
B01L 3/00 (2006.01); A61L 27/16 (2006.01); A61L 27/56 (2006.01); B01F 23/00 (2022.01); B01F 23/41 (2022.01); B01F 101/23 (2022.01); B01L 7/00 (2006.01); B01L 9/00 (2006.01); B23Q 17/24 (2006.01); C07K 14/705 (2006.01); C08F 220/56 (2006.01); C08L 33/26 (2006.01); C12M 1/34 (2006.01); C12Q 1/04 (2006.01); C12Q 1/18 (2006.01); C12Q 1/6844 (2018.01); C12Q 1/686 (2018.01); G01N 1/31 (2006.01); G01N 21/17 (2006.01); G01N 21/3577 (2014.01); G01N 21/359 (2014.01); G01N 21/39 (2006.01); G01N 21/45 (2006.01); G01N 21/64 (2006.01); G01N 21/77 (2006.01); G01N 21/78 (2006.01); G01N 27/414 (2006.01); G01N 30/12 (2006.01); G01N 30/68 (2006.01); G01N 30/70 (2006.01); G01N 30/72 (2006.01); G01N 30/88 (2006.01); G01N 33/00 (2006.01); G01N 33/18 (2006.01); G01N 33/50 (2006.01); G01N 33/53 (2006.01); G01N 33/543 (2006.01); G01N 33/68 (2006.01); G01N 33/74 (2006.01); G01N 35/00 (2006.01); G01N 35/04 (2006.01); G01N 35/10 (2006.01); G06T 7/00 (2017.01); G06T 7/90 (2017.01); H10K 10/46 (2023.01); H10K 85/00 (2023.01); H10K 85/20 (2023.01);
U.S. Cl.
CPC ...
G01N 35/04 (2013.01); G01N 2035/0415 (2013.01); G01N 2035/0441 (2013.01); G01N 2035/0465 (2013.01);
Abstract

In an automatic analysis device, it is possible during specimen analysis to add/deposit one rack at a time without stopping the analysis, and it is easy to ascertain the analysis sequence. The analyzer has an analysis module, a rack transport module for transporting a specimen rack in which a specimen container storing a specimen is loaded, and a control device. The rack transport module includes a rack supply part for supplying a specimen rack, a rack accommodating part for accommodating a specimen rack, a rack transport line for transporting a specimen rack supplied from the rack supply part, a dispensing line for transporting a specimen rack to the analysis module, and a rack rotor for transferring a specimen rack between the rack transport line and the dispensing line. Operation of the rack supply part for supplying a specimen rack can be stopped independently of the operation of the analysis module.

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