The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 04, 2025

Filed:

Apr. 04, 2022
Applicant:

Korea Research Institute of Standards and Science, Daejeon, KR;

Inventors:

Jong Moon Ha, Daejeon, KR;

Won Jae Choi, Daejeon, KR;

Hong Min Seung, Daejeon, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 29/44 (2006.01); G01N 29/024 (2006.01); G06N 3/0455 (2023.01); G06N 3/08 (2023.01);
U.S. Cl.
CPC ...
G01N 29/4472 (2013.01); G01N 29/024 (2013.01); G06N 3/0455 (2023.01); G06N 3/08 (2013.01); G01N 2291/011 (2013.01); G01N 2291/023 (2013.01); G01N 2291/0289 (2013.01); G01N 2291/101 (2013.01);
Abstract

An ultrasonic NDT method and system, which can extract and analyze a defect signal even when a signal reflected from a defect interferes with a unique initial pulse of an ultrasonic transducer or a signal reflected from the surface of a test object, and an autoencoder-based prediction model training method used therefor. The method may include acquiring a measured signal by transmitting an ultrasonic wave to a test object and receiving an ultrasonic wave reflected from the test object; inputting the measured signal to an autoencoder-based prediction model and predicting a reference signal which is to be expected to be measured from a test object with no defect; calculating a residual signal as the absolute value of a difference between the measured signal and the reference signal; and analyzing information on a defect contained in the test object by analyzing the residual signal.


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